Acronym in imaging technology: UEM for ultrafast electron microscopy

In nanoscience, UEM stands for ultrafast electron microscopy. This technology is applicable to studies in materials science, mineralogy, nanotechnology and biology by providing real-space images, diffraction patterns and energy spectra at the nanoscale. Short nanomovies, demonstrating the nanoscopic imaging capability of UEM, can be viewed online at ScientificAmerican.com/aug2010/nanomovies.

Selected References
[1] Ultrafast Science & Technology: Ultrafast Electron Microscopy.
[2] Casey Johnston: Taking videos with ultrafast electron microscopy.
[3] Ahmed H. Zewail: Filming the invisible in 4-D. Sci. Am. August 2010, 303 (2), pp. 74-81.
[4] V. A. Lobastov, J. Weissenrieder, J. Tang and A. H. Zewail: Ultrafast Electron Microscopy (UEM): Four-Dimensional Imaging and Diffraction of Nanostructures during Phase Transition. Nano Lett. 2007, 7 (9), pp. 2552-2558.
DOI: 10.1021/nl071341e.
[5] V. A. Lobastov, R. Srinivasa and A. H. Zewail: Four-dimensional ultrafast electron microscopy. PNAS May 2005, 102 (20), pp. 7069-7073. DOI: 10.1073/pnas.0502607102.